Ballistic Electron Emission Microscopy And Internal Photoemission Study On Metal Bi-Layer/Oxide/Si, High-K Oxide/Si, And “End-On” Metal Contacts To Vertical Si Nanowires
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Ballistic Electron Emission Microscopy And Internal Photoemission Study On Metal Bi-Layer/Oxide/Si, High-K Oxide/Si, And “End-On” Metal Contacts To Vertical Si Nanowires